SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT APPARATUS, SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT METHOD, AND RECORDING MEDIUM WITH THE METHOD RECORDED

摘要

PROBLEM TO BE SOLVED: To evaluate effects of parasitic elements caused between a semiconductor integrated circuit and a carrier substrate in a design stage. SOLUTION: An analytical model to be analyzed in a design stage of a semiconductor integrated circuit is not closed only in the semiconductor integrated circuit, but an analytical model including a circuit substrate mounted with the semiconductor integrated circuit and parasitic elements between the circuit substrate and the semiconductor integrated circuit as well as the semiconductor integrated circuit is generated and analyzed to evaluate effects of the parasitic elements caused between the semiconductor integrated circuit and a carrier substrate in the design stage. COPYRIGHT: (C)2007,JPO&INPIT