发明名称 DYNAMIC SHAPE MEASURING METHOD AND DYNAMIC SHAPE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To largely shorten the measurement time for acquiring height data at a plurality of times required for displaying moving image display of an MEMS (Micro Electro Mechanical System) operation. SOLUTION: A stroboscopic phase shift interference device sets optical path difference, measures the height of the MEMS under operation at a plurality of phases at three or more points with respect to the set optical path difference, calculates an estimation equation of height locus of the MEMS under operation, and determines the shape of the MEMS under operation by calculation. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007240344(A) 申请公布日期 2007.09.20
申请号 JP20060063685 申请日期 2006.03.09
申请人 FUJITSU LTD 发明人 TAKAHASHI FUMIYUKI;FUSE TAKASHI;TSUKAHARA HIROYUKI
分类号 G01B11/24;G01B11/02 主分类号 G01B11/24
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