发明名称 METHOD AND DEVICE FOR EVALUATING RESIDUAL WALL THICKNESS BY EDDY CURRENT FLAW DETECTION
摘要 PROBLEM TO BE SOLVED: To provide an evaluation method hard to receive the effect of crack length and is capable of performing the evaluation of residual wall thickness with high accuracy, and to provide an evaluation device. SOLUTION: Eddy current flaw detection due to a plurality of test frequencies is applied to a relative test object, provided with a plurality of slits different in residual wall thickness to obtain a calibration curve group, showing the correlation of the phase difference of an ECT signal between two different test frequencies, with respect to the respective slits and the residual wall thickness. Furthermore, the eddy current flaw detection due to a plurality of test frequencies is applied to an inspection target to calculate the phase difference of the ECT signal between two different test frequencies. The calculated phase difference and the phase difference of the calibration curve group are compared to each other, to evaluate the residual wall thickness from the inspection surface of the inspection target to the internal crack thereof. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007240256(A) 申请公布日期 2007.09.20
申请号 JP20060061274 申请日期 2006.03.07
申请人 HITACHI LTD 发明人 NISHIMIZU AKIRA;YOSHIDA ISAO;KOIKE MASAHIRO;NONAKA YOSHIO
分类号 G01N27/90;G01B7/06 主分类号 G01N27/90
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