发明名称 |
Substrates Including Gallium Nitride Layers and a Method of Producing the Same |
摘要 |
In a substrate having a gallium nitride layer, surface damage after surface treatment of the gallium nitride layer is reduced and quality of a functional device formed thereon is improved. A substrate 4 having at least a gallium nitride layer 4 is provided. A plasma etching system equipped with an inductively coupled plasma generating system is used and a fluorine-based gas is introduced at a standardized direct current bias potential of −10V/cm2 or higher to subject a surface 3a of the gallium nitride layer to dry etching treatment. |
申请公布号 |
US2016300980(A1) |
申请公布日期 |
2016.10.13 |
申请号 |
US201615190672 |
申请日期 |
2016.06.23 |
申请人 |
NGK INSULATORS, LTD. |
发明人 |
Higashihara Shuhei;Iwai Makoto;Imai Katsuhiro |
分类号 |
H01L33/00;H01L33/32 |
主分类号 |
H01L33/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of producing a substrate comprising a surface gallium nitride layer, said method comprising:
using a plasma etching system comprising a plasma generating system of inductively coupled type; and introducing a fluorine-based gas to perform a dry etching treatment of a surface of said gallium nitride layer. |
地址 |
Aichi-prefecture JP |