发明名称 Substrates Including Gallium Nitride Layers and a Method of Producing the Same
摘要 In a substrate having a gallium nitride layer, surface damage after surface treatment of the gallium nitride layer is reduced and quality of a functional device formed thereon is improved. A substrate 4 having at least a gallium nitride layer 4 is provided. A plasma etching system equipped with an inductively coupled plasma generating system is used and a fluorine-based gas is introduced at a standardized direct current bias potential of −10V/cm2 or higher to subject a surface 3a of the gallium nitride layer to dry etching treatment.
申请公布号 US2016300980(A1) 申请公布日期 2016.10.13
申请号 US201615190672 申请日期 2016.06.23
申请人 NGK INSULATORS, LTD. 发明人 Higashihara Shuhei;Iwai Makoto;Imai Katsuhiro
分类号 H01L33/00;H01L33/32 主分类号 H01L33/00
代理机构 代理人
主权项 1. A method of producing a substrate comprising a surface gallium nitride layer, said method comprising: using a plasma etching system comprising a plasma generating system of inductively coupled type; and introducing a fluorine-based gas to perform a dry etching treatment of a surface of said gallium nitride layer.
地址 Aichi-prefecture JP