发明名称 Insulated Gate Bipolar Transistor and Production Method Thereof
摘要 One embodiment of the present invention includes preparing a first conductive semiconductor substrate manufactured using the MCZ method. A second conductive base layer (12), first conductive emitter regions (13), and gate electrodes (14) are formed on a first surface of the semiconductor substrate. The semiconductor substrate is thinned by machining the second surface of the semiconductor substrate and a second conductive collector layer (15) is formed by implanting boron into the thinned second surface. A first conductive buffer layer (16) having a higher impurities concentration than the semiconductor substrate is formed by implanting hydrogen into an area inside the semiconductor substrate and adjacent to the collector layer (15).
申请公布号 US2016300938(A1) 申请公布日期 2016.10.13
申请号 US201415103671 申请日期 2014.12.02
申请人 Ulvac, Inc. 发明人 Tonari Kazuhiko;Nakagawa Akio;Yokoo Hidekazu;Suzuki Hideo
分类号 H01L29/739;H01L21/324;H01L29/66;H01L21/265;H01L29/06;H01L29/10 主分类号 H01L29/739
代理机构 代理人
主权项 1. A method of producing an insulated gate bipolar transistor, comprising: preparing a first conductive type semiconductor substrate manufactured by an MCZ method; forming a second conductive type base layer on a first surface of the semiconductor substrate; forming a first conductive type emitter region on a surface of the base layer; forming a gate electrode that is insulated from the emitter region, the base layer and the semiconductor substrate on the first surface; thinning the semiconductor substrate by machining the second surface of the semiconductor substrate; forming a second conductive type collector layer by implanting boron into the thinned second surface of the semiconductor substrate; and forming a first conductive type buffer layer having a higher impurity concentration than the semiconductor substrate by implanting hydrogen into an area inside the semiconductor substrate and adjacent to the collector layer.
地址 Kanagawa JP