发明名称 |
SOLID STATE IMAGE PICKUP DEVICE AND SOLID STATE IMAGE PICKUP DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a solid state image pickup device and a solid state image pickup device manufacturing method which can simplify a manufacturing process.SOLUTION: A solid state image pickup device according to an embodiment comprises a plurality of photoelectric conversion elements, a field effect transistor, trenches and a P-type impurity diffusion region. The plurality of photoelectric conversion elements are arranged two-dimensionally in a semiconductor layer. The field effect transistor has N-type source and drain on a surface side of the semiconductor layer. The trenches pierce the semiconductor layer from a surface to a rear face to surround respective photoelectric conversion element and each of which has a width increasing with the increasing distance from the surface of the semiconductor layer toward a position at a predetermined depth and not increasing at a position deeper than the position at the predetermined depth. The P-type impurity diffusion region is provided in a lateral face of the trench and has a P-type impurity concentration at a portion of the semiconductor layer from the surface to the position at the predetermined depth is lower than a P-type impurity concentration at a portion deeper than the position at the predetermined depth.SELECTED DRAWING: Figure 3 |
申请公布号 |
JP2016187007(A) |
申请公布日期 |
2016.10.27 |
申请号 |
JP20150066967 |
申请日期 |
2015.03.27 |
申请人 |
TOSHIBA CORP |
发明人 |
FUKASE KAZUYA;OGURO TATSUYA;MOMOSE HISAYO;MOROOKA SATORU;KANEMURA TAKANAGA |
分类号 |
H01L27/146;H01L21/265;H01L21/76 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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