发明名称 Optical constants measurement system e.g. for reflectance and refraction uses a common bench with tiltable ellipsoidal mirrors to set up optical paths between a light source, sample and detector
摘要 <p>An optical measurement system where first and second optical paths are set up by projecting light to intersect in a window of a sliding holder (SH) in which a sample can be interposed, or withdrawn, from the selected optical path. The intensity of light can be measured after it has been reflected from either face of a sample, or refracted by the sample.</p>
申请公布号 DE102004002194(A1) 申请公布日期 2005.08.04
申请号 DE20041002194 申请日期 2004.01.15
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, TOKIO/TOKYO 发明人 KAWATE, ETSUO
分类号 G01J3/08;G01M11/02;G01N21/55;G01N21/59;(IPC1-7):G01N21/00;G01N21/41;G01N21/17;G01J3/02;G01J1/04 主分类号 G01J3/08
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