发明名称 Photomultiplier Tube, Image Sensor, And An Inspection System Using A PMT Or Image Sensor
摘要 A system for inspecting a sample including a detector, either a photomultiplier tube or an electron-bombarded image sensor, that is positioned to receive light from the sample. The detector includes a semiconductor photocathode and a photodiode. Notably, the photodiode includes a p-doped semiconductor layer, an n-doped semiconductor layer formed on a first surface of the p-doped semiconductor layer to form a diode, and a pure boron layer formed on a second surface of the p-doped semiconductor layer. The semiconductor photocathode includes silicon, and further includes a pure boron coating on at least one surface.
申请公布号 US2016300701(A1) 申请公布日期 2016.10.13
申请号 US201615189871 申请日期 2016.06.22
申请人 KLA-Tencor Corporation 发明人 Chuang Yung-Ho Alex;Brown David L.;Fielden John
分类号 H01J40/06;H01L31/103;H01L31/0216;H01J43/08 主分类号 H01J40/06
代理机构 代理人
主权项 1. A system for inspecting a sample, the system comprising: a laser system for generating light; first components for directing the light to the sample; one or more detectors; and second components for directing light from the sample to the one or more detectors, wherein said one or more detectors include a photomultiplier tube, the photomultiplier tube comprising: a semiconductor photocathode; and a photodiode including: a p-doped semiconductor layer;a n-doped semiconductor layer formed on a first surface of the p-doped semiconductor layer to form a diode; anda pure boron layer formed on a second surface of the p-doped semiconductor layer, wherein the semiconductor photocathode comprises silicon, and wherein the semiconductor photocathode further comprises a pure boron coating on at least one surface.
地址 Milpitas CA US