发明名称 |
Photomultiplier Tube, Image Sensor, And An Inspection System Using A PMT Or Image Sensor |
摘要 |
A system for inspecting a sample including a detector, either a photomultiplier tube or an electron-bombarded image sensor, that is positioned to receive light from the sample. The detector includes a semiconductor photocathode and a photodiode. Notably, the photodiode includes a p-doped semiconductor layer, an n-doped semiconductor layer formed on a first surface of the p-doped semiconductor layer to form a diode, and a pure boron layer formed on a second surface of the p-doped semiconductor layer. The semiconductor photocathode includes silicon, and further includes a pure boron coating on at least one surface. |
申请公布号 |
US2016300701(A1) |
申请公布日期 |
2016.10.13 |
申请号 |
US201615189871 |
申请日期 |
2016.06.22 |
申请人 |
KLA-Tencor Corporation |
发明人 |
Chuang Yung-Ho Alex;Brown David L.;Fielden John |
分类号 |
H01J40/06;H01L31/103;H01L31/0216;H01J43/08 |
主分类号 |
H01J40/06 |
代理机构 |
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代理人 |
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主权项 |
1. A system for inspecting a sample, the system comprising:
a laser system for generating light; first components for directing the light to the sample; one or more detectors; and second components for directing light from the sample to the one or more detectors, wherein said one or more detectors include a photomultiplier tube, the photomultiplier tube comprising: a semiconductor photocathode; and a photodiode including:
a p-doped semiconductor layer;a n-doped semiconductor layer formed on a first surface of the p-doped semiconductor layer to form a diode; anda pure boron layer formed on a second surface of the p-doped semiconductor layer, wherein the semiconductor photocathode comprises silicon, and wherein the semiconductor photocathode further comprises a pure boron coating on at least one surface. |
地址 |
Milpitas CA US |