发明名称 Cleaning Solution for a Semiconductor Wafer
摘要 A cleaning solution for a semiconductor wafer comprises ammonia, hydrogen peroxide, a complexing agent and a block copolymer surfactant diluted in water. The cleaning solution can be used in single wafer cleaning tools to remove both particulate contaminants and metallic residues.
申请公布号 US2008221004(A1) 申请公布日期 2008.09.11
申请号 US20050914870 申请日期 2005.05.25
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 FARKAS JANOS
分类号 C11D7/00 主分类号 C11D7/00
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