| 摘要 |
[Problem] To provide a structured illumination microscope capable of creating a super resolution image for a sample with a thickness greater than the focal depth of the imaging optics. [Solution] A structured illumination microscope (1) comprises: first illumination optics (11) for irradiating a sample along a first direction (X direction) with activation light for activating a fluorescent material contained in a sample (S); second illumination optics (31) for irradiating the sample with an interference fringe along a second direction (Z direction), different from the first direction, with excitation light for exciting the fluorescent material; a control unit (7) for controlling the direction and phase of the interference fringe; imaging optics (55) for forming an image of the sample irradiated with the interference fringe; an imaging element (56) for creating a first image by capturing the image formed by the imaging optics; and a demodulating unit (6) for creating a second image using a plurality of first images created by the imaging element. |
