发明名称 METHOD FOR FABRICATING METAL SILICIDE LAYER AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
摘要 The technical idea of the present invention provides a method for fabricating a metal silicide layer to minimize contact resistance, and a method for fabricating a semiconductor device using the same. The method for fabricating a metal silicide layer includes a step of forming a doping layer having dopant in a surface part of a semiconductor substrate; a step of forming a metal-silicon composite layer by depositing metal and silicon on the doping layer; and a step of forming a metal silicide layer by performing silicidation on the metal-silicon composite layer.
申请公布号 KR20160101517(A) 申请公布日期 2016.08.25
申请号 KR20150024237 申请日期 2015.02.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, CHOONG RAE
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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