发明名称 |
METHOD FOR FABRICATING METAL SILICIDE LAYER AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING THE SAME |
摘要 |
The technical idea of the present invention provides a method for fabricating a metal silicide layer to minimize contact resistance, and a method for fabricating a semiconductor device using the same. The method for fabricating a metal silicide layer includes a step of forming a doping layer having dopant in a surface part of a semiconductor substrate; a step of forming a metal-silicon composite layer by depositing metal and silicon on the doping layer; and a step of forming a metal silicide layer by performing silicidation on the metal-silicon composite layer. |
申请公布号 |
KR20160101517(A) |
申请公布日期 |
2016.08.25 |
申请号 |
KR20150024237 |
申请日期 |
2015.02.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, CHOONG RAE |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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