发明名称 コンタクトプローブ
摘要 PROBLEM TO BE SOLVED: To provide a technique for reducing a contact resistance between a contact probe and an electrode pad.SOLUTION: A contact probe 11 contacts an electrode pad of an inspection target 7. The contact probe 11 includes: a contact portion 15 having a contact surface 30 in contact with the electrode pad and exhibiting flexibility; and a pressurization portion 13 pressurizing the contact portion 15 to press the contact surface 30 on the electrode pad.
申请公布号 JP6029535(B2) 申请公布日期 2016.11.24
申请号 JP20130110568 申请日期 2013.05.27
申请人 三菱電機株式会社 发明人 秋山 肇;岡田 章;山下 欽也
分类号 G01R1/073;G01R31/26 主分类号 G01R1/073
代理机构 代理人
主权项
地址