发明名称 PHOTORESIST RESIDUE CLEANING FLUID
摘要 A cleaning fluid free of fluoride and hydroxylamine and used for removing a photoresist etching residue, and a composition thereof, the fluid, having a low etching property, comprising: a) an alcohol amine, b) a solvent, c) water, d) a phenol, e) an ethoxylated acetylenic alcohol compound, f) a hydrazine and a derivative thereof, and g)<b/>a polyol. The cleaning fluid for removing a photoresist etching residue and having a low etching property can rapidly remove a crosslinked and hardened photo-etching glue after complex chemical changes caused by hard baking, dry-etching, ashing and plasma implantation, and can remove the photoresist residue on a metal wire, a via and a metal pad wafer without attacking the substrate, including metals such as aluminum or copper and non-metals such as silicon dioxide. The cleaning fluid has a good prospect of application in the field of semiconductor chip cleaning and the like.
申请公布号 WO2016101333(A1) 申请公布日期 2016.06.30
申请号 WO2015CN00897 申请日期 2015.12.14
申请人 ZHENG, FEN;LIU, BING;SUN, GUANGSHENG;HUANG, DAHUI 发明人 ZHENG, FEN;LIU, BING;SUN, GUANGSHENG;HUANG, DAHUI
分类号 C11D3/30;B08B3/04;H01L21/304 主分类号 C11D3/30
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