发明名称 PROBE UNIT AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To improve workability in maintenance by detachably attaching a component provided on an inner face of a probe unit 31 from the outside, without turning frontward the probe unit 31. SOLUTION: The probe unit 31 is used for inspecting a liquid crystal panel 37. The probe unit 31 includes a fixed block 40 for supporting the whole, and attaching block 41 supported by the fixed block 40, a support block 42 integrally attached to the attaching block 41, a block assembly 34 inserted into the support block 42 to be supported, and a connection cable part 35 supported on an inner face of the support block 42 and electrically connected to the block assembly 34. An expanded part 70 expanded more than a width of the attaching block 41 is provided in the support block 42, and a tapped hole 71 is provided in the support block 42 to detachably attach a screw 72 for fixing the connection cable part 35 to the expanded part 70 from the outside of a device body. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007322158(A) 申请公布日期 2007.12.13
申请号 JP20060150176 申请日期 2006.05.30
申请人 MICRONICS JAPAN CO LTD 发明人 SAITO TOYOKAZU;AKAHIRA MEGUMI;MIURA KAZUYOSHI
分类号 G01R1/073;G02F1/13 主分类号 G01R1/073
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