| 摘要 |
The test apparatus according to the present invention includes: a data sampler for acquiring a plurality of data sample values for data signals from the DUT; a data change point detection section for detecting a data change point from the sample value; a data change point storage section for writing the data change point based on CLK 1 and for reading the same based on CLK 2 ; a clock sampler for acquiring a plurality of clock sample values for clock signals from the DUT; a clock change point detection section for detecting a clock change point from the sample value; a clock change point storage section for writing the clock change point based on CLKs and reading the same based on CLK 2 ; a phase difference detection section for detecting the phase difference between the data change point and the clock change point which are simultaneously read from the data change point storage section and the clock change point storage section; and a spec comparison section for comparing the phase difference with the spec to determine that DUT is passed or failed.
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