发明名称 TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To make efficient pursuing the causes of abnormalities generated in a testing unit and setting programs thereof. SOLUTION: The testing device that tests devices to be tested comprises a plurality of testing units that test the devices to be tested; a controller that sends commands to the plurality of testing units, respectively and controls the operations of the plurality of testing units, respectively; and a trace memory that receives in sequence the commands sent from the controller to the plurality of testing units, respectively to store the commands. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008046074(A) 申请公布日期 2008.02.28
申请号 JP20060224078 申请日期 2006.08.21
申请人 ADVANTEST CORP 发明人 YAMASHITA HIRONAGA
分类号 G01R31/28;G01R35/00 主分类号 G01R31/28
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