| 摘要 |
The present disclosure relates to a system and method for analyzing a superconducting wire. A method in accordance with at least one embodiment described herein may include performing a voltage/current (VI) test for each of a plurality of portions of superconducting wire. The VI test may include determining a plurality of VI data points for each of the plurality of portions of superconducting wire at a first VI datapoint of about (Ic (critical current), Ec (critical electric field)) and at a second VI datapoint of about (Ix, Ex). Ex may be at least 10 times Ec and Ix may be approximately equal to the current resulting at that voltage drop. The method may further include analyzing the plurality of VI data points for each portion of superconducting wire to determine if one or more of the portions of superconducting wire are defective. Of course, numerous other embodiments are also within the scope of the present disclosure.
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