发明名称 Method of fabricating semiconductor device
摘要 A method of fabricating a semiconductor device includes the following steps. At least a first gate stack layer and at least a second gate stack layer protruding from a conductive layer on a substrate are provided. Subsequently, two spacers and a protective layer are formed on the conductive layer, and the two spacers and the protective layer jointly surround the protruded first gate stack layer and the protruded second gate stack layer. The two spacers and the protective layer are used as a mask to remove a part of the conductive layer. Afterwards, the two spacers and the protective layer are removed.
申请公布号 US9023726(B1) 申请公布日期 2015.05.05
申请号 US201314082200 申请日期 2013.11.18
申请人 United Microelectronics Corp. 发明人 Cheng Wei;Xu Ming Sheng;Liao Duan Quan;Chen Yikun;Tey Ching Hwa
分类号 H01L21/3205;H01L21/28;H01L21/8234 主分类号 H01L21/3205
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A method of fabricating a semiconductor device, comprising: providing at least a first gate stack layer protruding from a conductive layer on a substrate, wherein the first gate stack layer comprises a floating gate and a control gate on the floating gate; forming a first spacer on the conductive layer at a side of the first gate stack layer; and using the first spacer as a mask to remove a part of the conductive layer to form a select gate having a planar top surface.
地址 Science-Based Industrial Park, Hsin-Chu TW