On-board FIFO memory module for high speed digital sourcing and capture to/from DUT (device under test) using a clock from DUT

摘要

In a method and system for testing, a tester ( 110 ) is operable to communicate test signals ( 124, 126 ) at a tester clock speed, and a device ( 190 ) to be tested is operable to communicate the test signals ( 124, 126 ) at a device clock speed, the device clock speed being greater than the tester clock speed. A test module ( 120 ) is interposed between the tester ( 110 ) and the device ( 190 ) to enable data transfer between the tester ( 110 ) and the device ( 190 ) at their respective clock speeds. The test module ( 120 ) includes a memory module ( 250 ) capable of storing N samples of the test signals ( 124, 126 ) at a selectable one of the tester clock speed and the device clock speed. The memory module ( 250 ) is operable to provide the N samples at a selectable one of the tester clock speed and the device clock speed.