发明名称 Methods of forming SIC MOSFETs with high inversion layer mobility
摘要 Methods of forming an oxide layer on silicon carbide include thermally growing an oxide layer on a layer of silicon carbide, and annealing the oxide layer in an environment containing NO at a temperature greater than 1175° C. The oxide layer may be annealed in NO in a silicon carbide tube that may be coated with silicon carbide. To form the oxide layer, a preliminary oxide layer may be thermally grown on a silicon carbide layer in dry O<SUB>2</SUB>, and the preliminary oxide layer may be re-oxidized in wet O<SUB>2</SUB>.
申请公布号 US2008233285(A1) 申请公布日期 2008.09.25
申请号 US20060486752 申请日期 2006.07.14
申请人 CREE, INC. 发明人 DAS MRINAL K.;HULL BRETT;KRISHNASWAMI SUMI
分类号 C23C16/00;B05D3/02 主分类号 C23C16/00
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