发明名称 |
ECC CIRCUIT, SEMICONDUCTOR MEMORY DEVICE, MEMORY SYSTEM |
摘要 |
A syndrome generation section generates a syndrome from input data having d bits of data bits and k bits of parity bits. A syndrome table stores a syndrome pattern indicating that no error has occurred in the input data and syndrome patterns indicating an error position. A comparison section compares the syndrome generated by the syndrome generation section with the syndrome patterns in the syndrome table, outputs a match signal when a syndrome pattern matching the syndrome exists, and outputs a no-match signal when no syndrome pattern matching the syndrome exists. An error correction section corrects the error in the input data based on the match signal from the comparison section.
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申请公布号 |
US2010023840(A1) |
申请公布日期 |
2010.01.28 |
申请号 |
US20090480294 |
申请日期 |
2009.06.08 |
申请人 |
NAKAO YOSHIAKI;GOHOU YASUSHI;IWANARI SHUNICHI;MATSUURA MASANORI;MURAKUKI YASUO |
发明人 |
NAKAO YOSHIAKI;GOHOU YASUSHI;IWANARI SHUNICHI;MATSUURA MASANORI;MURAKUKI YASUO |
分类号 |
H03M13/05;G06F11/10 |
主分类号 |
H03M13/05 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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