发明名称 |
SYSTEM AND METHOD FOR INTEGRATED CIRCUIT USAGE TRACKING CIRCUIT WITH FAST TRACKING TIME FOR HARDWARE SECURITY AND RE-CONFIGURABILITY |
摘要 |
An accelerated aging circuit is described to shorten the required stress time to a few seconds of operation. Due to the challenges posed by process variation in advanced CMOS technology, a stochastic processing methodology is also described to reduce the failure rate of the tracking and detection. Combining both circuit and system level acceleration, the creation of a silicon marker can be realized within seconds of usage in contrast with days of operation from previously reported aging monitor. |
申请公布号 |
US2016329897(A1) |
申请公布日期 |
2016.11.10 |
申请号 |
US201615148700 |
申请日期 |
2016.05.06 |
申请人 |
Northwestern University |
发明人 |
Gu Jie |
分类号 |
H03K19/0175;H03K5/24;G06F1/26;H03K3/03 |
主分类号 |
H03K19/0175 |
代理机构 |
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代理人 |
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主权项 |
1. A system, comprising:
an aging accelerating circuit, the aging accelerating circuit to create a silicon marker during real-time operation to aid in determining a usage of a chip. |
地址 |
Evanston IL US |