发明名称 SYSTEM AND METHOD FOR INTEGRATED CIRCUIT USAGE TRACKING CIRCUIT WITH FAST TRACKING TIME FOR HARDWARE SECURITY AND RE-CONFIGURABILITY
摘要 An accelerated aging circuit is described to shorten the required stress time to a few seconds of operation. Due to the challenges posed by process variation in advanced CMOS technology, a stochastic processing methodology is also described to reduce the failure rate of the tracking and detection. Combining both circuit and system level acceleration, the creation of a silicon marker can be realized within seconds of usage in contrast with days of operation from previously reported aging monitor.
申请公布号 US2016329897(A1) 申请公布日期 2016.11.10
申请号 US201615148700 申请日期 2016.05.06
申请人 Northwestern University 发明人 Gu Jie
分类号 H03K19/0175;H03K5/24;G06F1/26;H03K3/03 主分类号 H03K19/0175
代理机构 代理人
主权项 1. A system, comprising: an aging accelerating circuit, the aging accelerating circuit to create a silicon marker during real-time operation to aid in determining a usage of a chip.
地址 Evanston IL US