| 摘要 |
PROBLEM TO BE SOLVED: To provide a product history management method of a semiconductor device capable of managing a product history without adding a special process to a conventional process.SOLUTION: The product history management method includes: a wafer inspection process for electrically inspecting a semiconductor chip 2 and, at the same time, storing a chip ID in the semiconductor chip 2; a package inspection process for electrically inspecting the semiconductor chip 2 and, at the same time, temporarily storing the chip ID, which is stored in the semiconductor chip 2, in a storage device 7; a marking process for marking the chip ID, which is stored in the storage device 7, on a package; and in addition, a process for inspecting the appearance of a semiconductor 1 in visual inspection by a reading device and, at the same time, reading a QR code 8 marked on a package 4 so as to perform inspection. This allows a product history to be managed without adding a special process to a conventional manufacturing process. |
