发明名称 EVALUATING DEVICE ANTENNA PERFORMANCE AND QUALITY
摘要 A method includes receiving over-the-air (OTA) performance test data measured for a first set of pass computing devices and for a second set of fail computing devices, measuring a first set of training data for the first and second set of computing devices during a plurality of KPI tests, measuring a second set of training data for a particular computing device, determining which ones of the plurality of KPIs qualify as clustering features, and determining a first set of KPI centers, a second set of KPI centers, and a third set of KPI centers, determining a first and a second dissimilarity distance separating the first set and the second set of computing devices from the particular device, respectively. The method further includes determining whether the first dissimilarity distance is greater than second dissimilarity distance to qualify the particular computing device to pass the OTA test.
申请公布号 US2016173211(A1) 申请公布日期 2016.06.16
申请号 US201414567044 申请日期 2014.12.11
申请人 Verizon Patent and Licensing Inc. 发明人 OUYANG Ye;BECHT Carol
分类号 H04B17/16;H04W24/10 主分类号 H04B17/16
代理机构 代理人
主权项 1. A method comprising: receiving, via a processor, over-the-air (OTA) performance test data measured for a first set of computing devices and for a second set of computing devices, wherein the first set of computing devices passed the over-the-air (OTA) performance test and the second set of computing device failed the OTA performance test, and wherein the computing devices of the first set and the second set are associated with a similar computing device type; measuring a first set of training data for the first and second set of computing devices during a plurality of tests, each performed for one of a plurality of key performance indicators (KPIs); measuring a second set of training data for a particular computing device during the plurality of tests, wherein the particular computing device is similar to the computing device type; determining which ones of the plurality of KPIs qualify as features to separate into clusters the first set of computing devices from the second set of computing devices based on the measured first set of training data; determining a first set of KPI centers, each of which corresponds to one the feature qualified KPIs, for the first set of computing devices, a second set of KPI centers for the second set of computing devices, and a third set of KPI centers for the particular computing device; determining a first dissimilarity distance separating the first set of computing devices and the particular computing device using the first set of KPI centers and the third set of KPI centers; determining a second dissimilarity distance separating the second set of computing devices and the particular computing device using the second set of KPI centers and the third set of KPI centers; determining which of the first dissimilarity distance and the second dissimilarity distance is greater; and based on a result of the determining step, qualifying the particular computing device to pass or fail the OTA test.
地址 Arlington VA US