| 发明名称 |
PRODUCTION TEST TRIMMING ACCELERATION |
| 摘要 |
Systems and methods for production test trimming acceleration. In an illustrative, non-limiting embodiment, a method may include providing a first trim code to a reference circuit, where the reference circuit is configured to output a first signal in response to the first trim code; integrating a difference between the first signal and a target voltage value into a first integrated value; providing a second trim code to the reference circuit, where the reference circuit is configured to output a second signal in response to the second trim code; integrating a difference between the second signal and the target voltage value into a second integrated value; and adjusting at least one of the first or second trim codes in response to a comparison between the first and second integrated values. |
| 申请公布号 |
US2016173076(A1) |
申请公布日期 |
2016.06.16 |
| 申请号 |
US201414571596 |
申请日期 |
2014.12.16 |
| 申请人 |
Freescale Semiconductor, Inc. |
发明人 |
da Silva, JR. Edevaldo Pereira;Chayachinda Joe;Coimbra Ricardo P.;Campos Marcelo de Paula |
| 分类号 |
H03K5/22;G01R19/165 |
主分类号 |
H03K5/22 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
providing a first trim code to a reference circuit, wherein the reference circuit is configured to output a first signal in response to the first trim code; integrating a difference between the first signal and a target voltage value into a first integrated value; providing a second trim code to the reference circuit, wherein the reference circuit is configured to output a second signal in response to the second trim code; integrating a difference between the second signal and the target voltage value into a second integrated value; and adjusting at least one of the first or second trim codes in response to a comparison between the first and second integrated values. |
| 地址 |
Austin TX US |
