发明名称 METROLOGY DEVICE AND ASSOCIATED METHOD
摘要 The invention relates to a metrology device (10) for determining the quality of a hygroscopic material (11), comprising a frame (12), a support element, two tips that can move in translation with respect to the frame (12), means for measuring a penetration effort of each tip as a function of a force applied to each tip, means for measuring an electrical resistivity between the ends of the two tips, which means are able to measure an electrical resistivity of the hygroscopic material when the two tips are inserted into the hygroscopic material (11), and means for measuring a penetration effort of the support element as a function of a force applied to the support element in order to achieve a predetermined fixing position, the support element being able to penetrate into the hygroscopic material (11) so as to fix the frame (12) to the hygroscopic material (11).
申请公布号 WO2016150882(A1) 申请公布日期 2016.09.29
申请号 WO2016EP56057 申请日期 2016.03.18
申请人 TECSAN 发明人 SANDOZ, Jean-Luc;BENNOIT, Yann;GASSER, Jean-Daniel
分类号 G01N33/46;G01M99/00;G01N3/42;G01N27/04 主分类号 G01N33/46
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