发明名称 SEMICONDUCTOR MEMORY
摘要 A semiconductor memory includes a memory cell including a resistance change element and a control circuit configured to perform OFF-write processing of applying an OFF-write pulse to the memory cell for switching the state of the memory cell to a high-resistive state where a resistance value of the resistance change element is at least a first reference value and ON-write processing of applying an ON-write pulse to the memory cell for switching the state of the memory cell to a low-resistive state where the resistance value is less than a second reference value. The control circuit performs the OFF-write processing by applying an auxiliary pulse which is smaller than the OFF-write pulse in voltage amplitude to the memory cell one or more time(s) after having applied the OFF-write pulse to the memory cell.
申请公布号 US2016267975(A1) 申请公布日期 2016.09.15
申请号 US201514964383 申请日期 2015.12.09
申请人 Renesas Electronics Corporation 发明人 TAKEUCHI Kiyoshi;Hase Takashi
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A semiconductor memory, comprising: a memory cell which includes a resistance change element and a selection transistor configured to control whether a potential difference between a bit line and a plate line is to be applied to the resistance change element or to be blocked; and a control circuit configured to perform a first write processing of applying a first write pulse to the memory cell in order to switch a state of the memory cell to a first resistive state where a resistance value of the resistance change element is at least a first reference value and a second write processing of applying a second write pulse to the memory cell in order to switch the state of the memory cell to a second resistive state where the resistance value of the resistance change element is less than a second reference value, wherein the control circuit performs the first write processing by applying a first auxiliary pulse, which is smaller than the first write pulse in voltage amplitude, one or more time(s) after having applied the first write pulse to the memory cell.
地址 Tokyo JP