发明名称 |
TRANSISTOR AND ELECTRONIC DEVICE |
摘要 |
A semiconductor device with favorable electrical characteristics or a highly reliable semiconductor device is provided. The semiconductor device is a transistor including a first oxide film. The first oxide film contains indium, an element M, and zinc. The first oxide film includes a region in which the atomic ratio of indium to the element M and zinc satisfies indium : element M:zinc = xb:yb:zb For xb:yb:zb, (1 - α1):(1 +α1):m1 or (1 -α2):(1 +α2):m2 is satisfied, where α1 is greater than or equal to -0.43 and less than or equal to 0.18, α2 is greater than or equal to -0.78 and less than or equal to 0.42, and m1 and m2 are each greater than 0.7 and less than or equal to 1. |
申请公布号 |
WO2016157016(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
WO2016IB51539 |
申请日期 |
2016.03.18 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
YAMAZAKI, Shunpei;SHIMOMURA, Akihisa |
分类号 |
H01L29/786;C23C14/08;H01L21/28;H01L21/336;H01L21/363;H01L21/8234;H01L21/8238;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/06;H01L27/08;H01L27/088;H01L27/092;H01L27/108;H01L27/11;H01L27/115;H01L27/146;H01L29/417;H01L29/423;H01L29/49;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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