| 摘要 |
The present invention relates to a micro-connector for a CIS module test socket wherein a body, into which a plurality of elastic pins are inserted, is divided into two parts of the top and the bottom, a space unit, where the elastic pin can be bent when assembling, is placed in the facing surface of the top and the bottom bodies by minutely crossing the top and the bottom bodies, and, when the elastic pin vertically contacts a terminal unit, which is the subject of a test, the elastic pin can elastically move up and down with no need for an additional part such as a spring. For this purpose, in a micro-connector having a plurality of elastic pins connecting a terminal unit of test equipment and a terminal unit of a CIS module, the micro-connector of the present invention is divided into a bottom body and a top body. The bottom body has a plurality of bottom pin holes into which the elastic pins are inserted with the same interval, and the top body has a plurality of top pin holes into which the elastic pins are inserted with the same interval for corresponding to the bottom pin holes. The facing surfaces of the top and the bottom bodies have top and bottom operating space units next to the top and the bottom pin holes. The top and the bottom operating space units provide a space for the pertinent elastic pins to be bent by being formed with a larger width than the top and the bottom pin holes. The top and the bottom bodies are fixated to cross to the sides for the elastic pins to be bent into the shape of ′S′ in the top and the bottom operating space units, and the elastic pins are made to be elevated elastically by the bent parts. |
