发明名称 Self-aligned liner formed on metal semiconductor alloy contacts
摘要 Metal semiconductor alloy contacts are provided on each of a source region and a drain region which are present in a semiconductor substrate. A transition metal is then deposited on each of the metal semiconductor alloy contacts, and during the deposition of the transition metal, the deposited transition metal reacts preferably, but not necessarily always, in-situ with a portion of each the metal semiconductor alloy contacts forming a transition metal-metal semiconductor alloy liner atop each metal semiconductor alloy contact. Each transition metal-metal semiconductor alloy liner that is provided has outer edges that are vertically coincident with outer edges of each metal semiconductor alloy contact. The transition metal-metal semiconductor alloy liner is more etch resistant as compared to the underlying metal semiconductor alloy. As such, the transition metal-metal semiconductor alloy liner can serve as an effective etch stop layer during any subsequently performed etch process.
申请公布号 US9093425(B1) 申请公布日期 2015.07.28
申请号 US201414177481 申请日期 2014.02.11
申请人 International Business Machines Corporation 发明人 Breil Nicolas;Lavoie Christian;Ozcan Ahmet S.;Schonenberg Kathryn T.;Yu Jian
分类号 H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119;H01L29/45;H01L29/78;H01L29/16;H01L29/66;H01L29/20;H01L21/285 主分类号 H01L29/76
代理机构 Scully, Scott, Murphy & Presser, P.C. 代理人 Scully, Scott, Murphy & Presser, P.C. ;Ivers, Esq. Catherine
主权项 1. A semiconductor structure comprising: a semiconductor substrate having a source region and a drain region located within a semiconductor material portion of said semiconductor substrate, wherein said source region and said drain region are spaced apart by a channel region; a functional gate structure located above said channel region; a source-side material stack of, from bottom to top, a source-side metal semiconductor alloy portion and a source-side transition-metal metal semiconductor alloy portion located on one side of said functional gate structure and located atop said source region; and a drain-side material stack of, from bottom to top, a drain-side metal semiconductor alloy portion and a drain-side transition metal-metal semiconductor alloy portion located on another side of said functional gate structure and located atop said drain region.
地址 Armonk NY US