MATERIAL ANALYSIS SENSOR AND MATERIAL ANALYSIS DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a material analysis sensor capable of estimating a component amount of the material while maintaining high precision.SOLUTION: A material analysis sensor includes: a light source part 3 for irradiating irradiation light P including a wavelength region relating to the estimation of a component amount of a material 2; a CPU for controlling an irradiation period; a light reception part 4 for receiving reflection light from a material so as to be outputted as a pulse signal PS and receiving disturbance light so as to output a noise signal NS; an integration part 5 for extracting the N number of pulse signals in a prescribed period and integrating the pulse signal so as to acquire a first integration value SU1 and extracting the N number of noise signals in the prescribed period and integrating the noise signal so as to acquire a second integration value SU2; and an extraction part for subtracting the second integration value for the first integration value so as to extract an amount of the reflection light. The irradiation light includes light of a first wavelength region to a third wavelength region. The integration part acquires each first integration value corresponding to the light of the wavelength regions and each second integration value corresponding to the first integration values. The extraction part subtracts each second integration value corresponding to the first integration values from the first integration values and extracts the amount of the reflection light for each light of the wavelength regions.SELECTED DRAWING: Figure 1