发明名称 |
SEMICONDUCTOR MEMORY UNIT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory unit which continues to normally operate using the semiconductor memory without exchanging the semiconductor memory even when a defective cell occurs in the semiconductor memory. SOLUTION: The semiconductor memory unit configured to access the semiconductor memory through a memory control circuit includes a section for detecting the defective cell of the semiconductor memory and a defective cell rescue section arranged in the memory control circuit to assign a relief cell to rescue the defective cell of the semiconductor memory based on the result of detection by the defect detecting section. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009020944(A) |
申请公布日期 |
2009.01.29 |
申请号 |
JP20070181955 |
申请日期 |
2007.07.11 |
申请人 |
YOKOGAWA ELECTRIC CORP |
发明人 |
YAMAZAKI YUICHI;SATO HIROYA |
分类号 |
G11C29/04;G06F12/16;G11C11/401;G11C11/413 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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