发明名称 SEMICONDUCTOR MEMORY UNIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory unit which continues to normally operate using the semiconductor memory without exchanging the semiconductor memory even when a defective cell occurs in the semiconductor memory. SOLUTION: The semiconductor memory unit configured to access the semiconductor memory through a memory control circuit includes a section for detecting the defective cell of the semiconductor memory and a defective cell rescue section arranged in the memory control circuit to assign a relief cell to rescue the defective cell of the semiconductor memory based on the result of detection by the defect detecting section. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009020944(A) 申请公布日期 2009.01.29
申请号 JP20070181955 申请日期 2007.07.11
申请人 YOKOGAWA ELECTRIC CORP 发明人 YAMAZAKI YUICHI;SATO HIROYA
分类号 G11C29/04;G06F12/16;G11C11/401;G11C11/413 主分类号 G11C29/04
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