发明名称 CAPACITOR INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a capacitor inspection method which ensures at a high level a capacitor used for various kinds of electronic device through non-destructive test. SOLUTION: The capacitor is comprised of: an element 1 whose positive and negative electrodes are led out from both ends; a metal case 5 housing the element 1; and a terminal board 6 provided at the opening of the metal case 5. Laser light is irradiated to the capacitor from the external surface of the terminal board 6 and the metal case 5, and a surface not irradiated by laser of the terminal board 6 and the metal case 5 of a capacitor in which one electrode of the element 1 is bonded to the internal surface of the terminal board 6 and the other electrode to the internal bottom of the metal case 5, respectively, is set as a reference surface. The terminal board 6 and the metal case 5 which are shifted by a specified distance to the side of the element 1 from the reference surface, and their sectional photo data are acquired by using an X-ray CT apparatus. According to the bonding area of the terminal board 6 and the metal case 5 and a collector is calculated, so as to determine whether the welding condition between the terminal board 6 and the metal case 5 and the element 1 is normal. Thus, the welding condition of the capacitor is accurately determined through the non-destructive test. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009059869(A) 申请公布日期 2009.03.19
申请号 JP20070225544 申请日期 2007.08.31
申请人 PANASONIC CORP 发明人 MIURA TERUHISA;SHIMIZU TOSHIAKI;MIZUTANI YOSHIO
分类号 H01G13/00 主分类号 H01G13/00
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