发明名称 |
METHOD FOR MANUFACTURING EPITAXIAL SILICON WAFER |
摘要 |
The present invention is provided with: a rear surface oxide film forming step for forming an oxide film on the rear surface of a silicon wafer; a rear surface oxide film removing step for removing the oxide film on an outer peripheral portion of the silicon wafer; an argon annealing step for performing heat treatment under argon gas atmosphere; and an epitaxial film forming step for forming an epitaxial film on the front surface of the silicon wafer. The epitaxial film forming step has: a prebake step for etching a surface layer of the silicon wafer by heat treating the silicon wafer under a gas atmosphere containing hydrogen and hydrogen chloride; and an epitaxial film growing step for growing the epitaxial film on the front surface of the silicon wafer. |
申请公布号 |
WO2016174997(A1) |
申请公布日期 |
2016.11.03 |
申请号 |
WO2016JP61088 |
申请日期 |
2016.04.05 |
申请人 |
SUMCO CORPORATION |
发明人 |
NONAKA Naoya;KAWASHIMA Tadashi |
分类号 |
H01L21/20;C30B29/06;H01L21/205;H01L21/324 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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