发明名称 METHOD FOR MANUFACTURING EPITAXIAL SILICON WAFER
摘要 The present invention is provided with: a rear surface oxide film forming step for forming an oxide film on the rear surface of a silicon wafer; a rear surface oxide film removing step for removing the oxide film on an outer peripheral portion of the silicon wafer; an argon annealing step for performing heat treatment under argon gas atmosphere; and an epitaxial film forming step for forming an epitaxial film on the front surface of the silicon wafer. The epitaxial film forming step has: a prebake step for etching a surface layer of the silicon wafer by heat treating the silicon wafer under a gas atmosphere containing hydrogen and hydrogen chloride; and an epitaxial film growing step for growing the epitaxial film on the front surface of the silicon wafer.
申请公布号 WO2016174997(A1) 申请公布日期 2016.11.03
申请号 WO2016JP61088 申请日期 2016.04.05
申请人 SUMCO CORPORATION 发明人 NONAKA Naoya;KAWASHIMA Tadashi
分类号 H01L21/20;C30B29/06;H01L21/205;H01L21/324 主分类号 H01L21/20
代理机构 代理人
主权项
地址