发明名称 TESTING DEVICE, AND TESTING METHOD
摘要 Provided is a testing device for testing an object device. The testing device comprises a pattern memory for storing the data to be outputted to the object device, a device decision unit for deciding the propriety of the object device on the basis of an output signal outputted by the object device, a number information storing unit for storing the number information based on the number of H-logic data contained in input data to be stored by the pattern memory, a counter for counting, in response to the output data outputted by the pattern memory to the object device, the number of the H-logic data contained in the output data, and a pattern memory decision unit for deciding it, in case the number information of the input data stored by the number information storage unit and the number of the H-logic data counted by the counter are equal to each other, that the data stored by the pattern memory is correct.
申请公布号 KR20070088718(A) 申请公布日期 2007.08.29
申请号 KR20077013888 申请日期 2006.02.14
申请人 ADVANTEST CORPORATION 发明人 FUJISAKI KENICHI
分类号 G01R31/3183;G11C29/10 主分类号 G01R31/3183
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