| 主权项 |
1. A defect emulator module for a storage device, wherein the storage device includes a storage medium, the defect emulator module comprising:
a defect coefficient module configured to generate a first coefficient, wherein the first coefficient corresponds to a characteristic of a first defect to be emulated; a defect location module configured to determine a location at which the first defect is to be inserted within a read-back signal from the storage medium; and a defect signal generation module configured to modify the read-back signal from the storage medium based on (i) the first coefficient and (ii) the location, wherein the defect signal generation module modifies the read-back signal to (i) emulate the first defect in the read-back signal and (ii) indicate that the first defect exists at the location, and wherein the read-back signal is (i) not indicative of the first defect prior to being modified by the defect signal generation module and (ii) is indicative of the first defect subsequent to being modified by the defect signal generation module. |
