发明名称 Circuits with a trench capacitor having micro-roughened semiconductor surfaces and methods for forming the same
摘要 A method for forming a trench capacitor. The method includes forming a trench in a semiconductor substrate. A conformal layer of semiconductor material is deposited in the trench. The surface of the conformal layer of semiconductor material is roughened. An insulator layer is formed outwardly from the roughened, conformal layer of semiconductor material. A polycrystalline semiconductor plate is formed outwardly from the insulator layer in the trench.
申请公布号 US6025225(A) 申请公布日期 2000.02.15
申请号 US19980010729 申请日期 1998.01.22
申请人 发明人
分类号 H01L21/02;H01L21/334;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/02
代理机构 代理人
主权项
地址