发明名称 METHOD AND APPARATUS FOR AUTOMATIC TEST EQUIPMENT
摘要 <p>The traditional device interface board is replaced by a number of smaller strips containing one or more electrical components for interfacing the device under test and the test head. The device interface modules may mount to a stiffening member having a back bone and multiple ribs running through the stiffening member. The device interface strips can create a lattice-like structure for the interface circuitry. Individual circuits may be disposed on the interface strips to perform functionality relating to the device under test and/or the test head.</p>
申请公布号 WO2007050865(A1) 申请公布日期 2007.05.03
申请号 WO2006US41965 申请日期 2006.10.27
申请人 TERADYNE, INC.;PARRISH, FRANK, B.;CASTELLANO, DEREK, M. 发明人 PARRISH, FRANK, B.;CASTELLANO, DEREK, M.
分类号 G01R31/28;G01R1/073 主分类号 G01R31/28
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