发明名称 TEST JIG
摘要 PROBLEM TO BE SOLVED: To provide a test jig which can be crimped at stable contact pressure and is hardly detached during a test.SOLUTION: A test jig 1 is fitted to a terminal block so as to perform a test. The test jig 1 has three holding points. The test jig 1 comprises: an insulative holding part 7 locked to a projection provided above a conductive terminal of the terminal block; a conductive part 9 crimped to the conductive terminal of the terminal block; and a contact part 15 brought into contact with a case below the conductive terminal of the terminal block. The conductive part 9 has no elasticity, and pressure is applied by a leaf spring 13 provided as a separate member. Thus, the test jig may be crimped at stable contact pressure. Moreover, because the test jig is held at the three points, it is hardly detached during a test where force is applied in horizontal and lower directions. Also, the test jig only needs to be pulled upward at the time of removing.SELECTED DRAWING: Figure 1
申请公布号 JP2016122527(A) 申请公布日期 2016.07.07
申请号 JP20140260838 申请日期 2014.12.24
申请人 SEIKO ELECTRIC CO LTD 发明人 IZUMI YOSHIHIRO;TATEISHI SATORU
分类号 H01R43/00;H01R9/00 主分类号 H01R43/00
代理机构 代理人
主权项
地址