| 摘要 |
PROBLEM TO BE SOLVED: To simply test the characteristic of a device provided with an IC. SOLUTION: The diode voltage of an antistatic protection element Q01 provided in the IC in the device 11 is measured by passing a certain current through the element. By utilizing the antistatic protection element which is generally provided, necessity for a newly additional one for test can be eliminated. Moreover, the output current from the IC is converted into a voltage, the voltage is average by using a low-pass filter, then the averaged voltage is measured, and thereby the abnormality of the waveform of the output current generated when a large current flows through the IC is detected. By this way, the waveform of the output current can be simply inspected. COPYRIGHT: (C)2007,JPO&INPIT |
