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发明名称
SEMICONDUCTOR MEMORY AND METHOD FOR TESTING THE SAME
摘要
申请公布号
KR100880517(B1)
申请公布日期
2009.01.28
申请号
KR20070048605
申请日期
2007.05.18
申请人
发明人
分类号
G11C11/4193;G11C11/40;G11C29/00
主分类号
G11C11/4193
代理机构
代理人
主权项
地址
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