| 摘要 |
The invention is about a method for monitoring and detecting material characteristics, wherein a sample of the material (1) is radiated with electromagnetic radiation (2.1), and electromagnetic radiation (2.2) returns from the sample. The method is <b>characterized in that</b> image data (5.3) of an interference pattern formed by electromagnetic radiation returned from the microstructure of the material is collected with high resolution and with high speed imaging; acoustic data (5.2) is collected to form acoustic information on changes in microstructure characteristics of the material; and changes in microstructure characteristics are monitored and analyzed on the basis of the formed interference pattern information, the collected image data of the interference pattern and the formed acoustic information. Additionally a corresponding monitoring and detecting arrangement is claimed. |
