发明名称 |
N0N-VOLATILE MEMORY FOR HIGH INTEGRATION AND ITS MANUFACTURING METHOD |
摘要 |
PURPOSE: The action power can be reduced with the program by improving the coupling ratio surprisingly with reducing the area of the unit cell and increasing the capacitance of inter-poly dielectric layer between floating gate control gate. And the field combustion film can be thickened by improving etching loss by the over etching of the field combustion and etching floating gate and control gate without misalignment. CONSTITUTION: Non-volatile memory unit cell which has the program possesses source/drain which is composed of the second surreptitious use of electricity style on the first surreptitious use of electricity style semiconductor board with the field oxidation film, the first dielectric layer on the channel area which is formed between source/drain areas, the floating gate which is on the first dielectric layer, the control gate which wraps 4 sides on the direction of the word line and beat line or the floating gate upper part.
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申请公布号 |
KR20000009373(A) |
申请公布日期 |
2000.02.15 |
申请号 |
KR19980029734 |
申请日期 |
1998.07.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, JUNG HYEOK |
分类号 |
H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/421 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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