发明名称 THIN FILM TRANSISTOR SUBSTRATE HAVING METAL OXIDE SEMICONDUCTOR AND MANUFACTURING THE SAME
摘要 A method for manufacturing a thin film transistor substrate, the method can include a first mask process for forming a gate electrode on a substrate; a step for forming a gate insulating layer covering the gate electrode; a second mask process for forming a source electrode overlapping with one side of the gate electrode, and a drain electrode overlapping with other side of the gate electrode and being apart from the source electrode, on the gate insulating layer; and a third mask process for forming an oxide semiconductor layer extending from the source electrode to the drain electrode, and an etch stopper having the same shape and size with the oxide semiconductor layer on the oxide semiconductor layer.
申请公布号 US2016197107(A1) 申请公布日期 2016.07.07
申请号 US201615073278 申请日期 2016.03.17
申请人 LG DISPLAY CO., LTD. 发明人 LEE Sungkeun;SONG Yongtae;KANG Imkuk;YUN Sungjun;JEONG Woocheol
分类号 H01L27/12;H01L29/786;H01L21/02;H01L21/4763;H01L21/027;H01L29/66;H01L29/423 主分类号 H01L27/12
代理机构 代理人
主权项 1. A method for manufacturing a thin film transistor substrate, the method comprising: a first mask process for forming a gate electrode on a substrate; a step for forming a gate insulating layer covering the gate electrode; a second mask process for forming a source electrode overlapping with one side of the gate electrode, and a drain electrode overlapping with other side of the gate electrode and being apart from the source electrode, on the gate insulating layer; and a third mask process for forming an oxide semiconductor layer extending from the source electrode to the drain electrode, and an etch stopper having the same shape and size with the oxide semiconductor layer on the oxide semiconductor layer.
地址 Seoul KR