Adapting the usage configuration of integrated circuit input-output pads

摘要

A self-test procedure of an integrated circuit by testing for an electrical connection between first and second input-output pads of the integrated circuit. A control device is capable of adapting a functional configuration of usage of the first and second input-output pads in dependence on presence of the electrical connection. These techniques allow the integrated circuit to be used in a variety of contexts, without requiring physical customisation of the integrated circuit to adapt it to its usage context, in particular where connections from the context to the pads of the integrated circuit may be made to individual pads or may span more than one pad for example where the resolution of the printed circuit is lower than the chip.