发明名称 |
METHOD FOR MANUFACTURING A DUAL GATE DEVICE |
摘要 |
A method for manufacturing a dual gate is provided to simplify manufacturing processes by depositing in-situ a gate insulating layer and a gate electrode in the same equipment. A gate insulating layer(111) made of HfO2 or HfSiO is formed on a semiconductor substrate(110). A hafnium film is deposited on the gate insulating layer. A polysilicon layer is deposited on the hafnium film. By annealing the resultant structure, a hafnium silicide electrode(115) is formed on the gate insulating layer. At the time, the gate insulating layer and the hafnium film are deposited by in-situ using the same equipment.
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申请公布号 |
KR20060132289(A) |
申请公布日期 |
2006.12.21 |
申请号 |
KR20050052559 |
申请日期 |
2005.06.17 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SUNG, MIN GYU;LIM, KWAN YONG;CHO, HEUNG JAE |
分类号 |
H01L21/336;H01L21/335 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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