发明名称 METHOD FOR MANUFACTURING A DUAL GATE DEVICE
摘要 A method for manufacturing a dual gate is provided to simplify manufacturing processes by depositing in-situ a gate insulating layer and a gate electrode in the same equipment. A gate insulating layer(111) made of HfO2 or HfSiO is formed on a semiconductor substrate(110). A hafnium film is deposited on the gate insulating layer. A polysilicon layer is deposited on the hafnium film. By annealing the resultant structure, a hafnium silicide electrode(115) is formed on the gate insulating layer. At the time, the gate insulating layer and the hafnium film are deposited by in-situ using the same equipment.
申请公布号 KR20060132289(A) 申请公布日期 2006.12.21
申请号 KR20050052559 申请日期 2005.06.17
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SUNG, MIN GYU;LIM, KWAN YONG;CHO, HEUNG JAE
分类号 H01L21/336;H01L21/335 主分类号 H01L21/336
代理机构 代理人
主权项
地址