发明名称 Camera-aided focusing in optical metrology
摘要 A side camera is combined with a conventional optical metrology system to image the object during the focusing scan performed in normal focusing procedures. The camera is positioned in fixed spatial relation to the objective and with its focal plane in substantial alignment with the optical axis of the objective so as to image the object during the scan. The camera is used to monitor the illumination spot formed on the object by the beam projected through the system's objective. The in-focus position is found by moving the object such that the illumination spot coincides with the objective's focus seen through the camera.
申请公布号 US9215425(B1) 申请公布日期 2015.12.15
申请号 US201313758912 申请日期 2013.02.04
申请人 BRUKER NANO INC. 发明人 Farrell Colin;van Burken Jan
分类号 H04N7/18 主分类号 H04N7/18
代理机构 代理人 Durando Antonio R.
主权项 1. Focusing apparatus in a measurement system for optical metrology wherein optical measurement signals are detected by a measurement detector through a measurement optical assembly, comprising: a measurement optical assembly with a focal point along an optical axis thereof; a stage adapted to receive a sample; a scanning mechanism for effecting a focusing scan by varying a distance between the sample and the measurement optical assembly; and a side camera; said camera being in addition to the measurement detector of the system and having an optical axis positioned at an angle in relation to the optical axis of the measurement optical assembly so as to image an illumination spot produced on the sample during said focusing scan.
地址 Santa Barbara CA US