发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 In a side entry type sample holder, vibrations in the radial direction of the sample holder provoke a resolving power decrease in the measurement results. In the present invention, the side entry type sample holder (105) has a stepped portion (210) in the radial direction of an axial portion. The sample stage (104) has a support part (213) contacting the stepped portion (210) in a cylindrical portion (202) capable of moving as one body in the axis direction of the sample holder (105), and, through the contact between the stepped portion (210) and the support part (213), a frictional force is generated, opposing the radial direction of the axial portion in the sample holder. In this manner, the vibrations in the radial direction of the sample holder are suppressed, and the resolving power decrease in the measurement results is suppressed.
申请公布号 WO2016114033(A1) 申请公布日期 2016.07.21
申请号 WO2015JP84230 申请日期 2015.12.07
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 YABATA KIYOSHI;KIKUCHI HIDEKI;MARUYAMA NAOTOMO
分类号 H01J37/20 主分类号 H01J37/20
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