发明名称 STRUCTURAL DAMAGE DETECTION
摘要 Disclosed is a method of assessing a structural defect presence in a structure, the method comprising the steps of: determining at least one critical damage strain value of the structure, capturing a first image of a surface of the structure under a first loading condition; capturing a second image of the surface of the structure under a second loading condition; assigning a position matrix on the captured first image; obtaining a deformation matrix comprising a deformation value at each position of the position matrix by using an image correlation technique on the first and second images, and by comparing deformation of corresponding parts of the surface captured therein; calculating a strain matrix using the obtained deformation matrix; and determining a micro-crack to be present at a position if an element of the strain matrix representing the strain at the position is greater than or equal to a predetermined critical damage strain value, wherein the critical damage strain value is a strain value at which a micro-crack is detected or predicted to appear and/or propagate.
申请公布号 WO2016113551(A1) 申请公布日期 2016.07.21
申请号 WO2016GB50062 申请日期 2016.01.12
申请人 BAE SYSTEMS PLC 发明人 CHEN, JIYE;MAMAND, HEMAN
分类号 G01M5/00;G01B11/16;G01N3/06;G01N21/88 主分类号 G01M5/00
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