发明名称 SEMICONDUCTOR DEVICE HAVING AN IMPROVED INTERLAYER CONTACT AND MANUFACTURING METHOD THEREOF
摘要 A silicon semiconductor substrate has a plurality of active regions having an impurity region and an isolating region which electrically isolates these active regions from each other. The isolating region is formed of a silicon nitride film. A contact hole penetrates an interlayer insulating film and reaches an impurity region. In this semiconductor device, when the contact hole falls across the impurity region and the isolating region, an amount of erosion in the isolating region is reduced.
申请公布号 US2001042892(A1) 申请公布日期 2001.11.22
申请号 US19980208477 申请日期 1998.12.10
申请人 OKADA MASAKAZU;HIGASHITANI KEIICHI;KAWASHIMA HIROSHI 发明人 OKADA MASAKAZU;HIGASHITANI KEIICHI;KAWASHIMA HIROSHI
分类号 H01L21/76;H01L21/28;H01L21/60;H01L21/768;H01L23/485;H01L23/522;H01L29/78;(IPC1-7):H01L31/119;H01L31/113;H01L29/94 主分类号 H01L21/76
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